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The nanoscale interpenetrating electron donor–acceptor network in organic bulk heterojunction (BHJ) solar cells results in efficient charge photogeneration but creates complex 3D pathways for charge transport. At present, little is known about the extent to which out‐of‐plane charge flow relies on lateral electrical connectivity. In this work, a procedure, based on conductive atomic force microscopy, is introduced to quantify lateral current spreading during out‐of‐plane charge transport. Using the developed approach, the dependence of lateral spreading on BHJ phase separation, composition, and molecule type (small molecule vs polymer) is studied. In the small‐molecule BHJ, 7,7′‐(4,4‐bis(2‐ethylhexyl)‐4H‐silolo[3,2‐b:4,5‐b′]dithiophene‐2,6‐diyl)bis(6‐fluoro‐4‐(5′‐hexyl‐[2,2′‐bithiophen]‐5‐yl)benzo[c]‐[1,2,5]thiadiazole):(6,6)‐Phenyl‐C₇₁‐butyric acid methyl ester (p‐DTS(FBTTh₂)₂:PC₇₁BM), an increase is observed in lateral hole current spreading as the population of donor crystallites, bearing an edge‐on molecular orientation, is increased. When integrated into BHJs, the polymer donor poly(3‐hexylthiophene‐2,5‐diyl) (P3HT) leads to greater lateral hole current spreading and more spatially uniform charge transport than the small‐molecule donor, owing to in‐plane charge transport along the polymer backbone. Through the newly introduced electrical characterization scheme, these experiments bring to light the role of lateral electrical connectivity in assisting charge navigation across BHJs.

The use of grazing‐incidence scattering methods for the characterization of 2D patterned organic thin films is limited due to the elongated 1D footprint of the X‐ray beam on the sample. However, this characteristic feature can be turned into an advantage, when combined with tomographic reconstruction. In this pilot study we show, how the use of a chosen texture reflection and a diffuse reflectivity signal can each provide 2D images of the deposits, simultaneously revealing the organic film's crystal orientation and the location of the metal electrodes in a field‐effect transistor structure from a single sequence of diffraction images.